Posted in | Microscopy

Particle Analysis in Scanning Electron Microscopy

From Nov 7 2024

JEOL’s specialized Particle Analysis Software automates the detection and energy-dispersive X-ray spectroscopy analysis of grains, inclusions, and particles, categorizing and sorting information based on composition, size, and shape. It is compatible with JEOL’s current SEM product line for micro- to nano-scale solutions.

Applications that profit from the use of PA3 include:

  • Additive manufacturing
  • Automotive cleanliness
  • Electronics
  • Forensics
  • Identifying foreign substances
  • Inclusions in metal alloys
  • Pharmaceutical products

This on-demand webinar, which features a complete introduction and Q&A session, was first presented during M&M 2021. Registration is required to view this webinar and demonstration. 

Image Credit: JEOL USA, Inc.

About the Presenters

Dave Edwards has 30 years of experience in scanning electron microscopy (SEM), including developing new detectors. He is an Organization of Scientific Area Committees for Chemistry and Instrumentation affiliate and member. Dave also has 12 years of experience as an EDS and SEM instructor, which he brings to this presentation.

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