Huge strides have been made over recent years concerning scanning electron microscopes (SEMs and EPMAs), especially when observing and chemically analyzing materials across various fields of interest, increasing analysts’ capabilities.
When dealing with extremely low voltages, some clearly defined sample preparation and handling procedures are worth following. Progress in X-ray spectroscopy (particularly in energy dispersive spectroscopy and a new innovative wavelength dispersive spectrometer) has also pushed the boundaries regarding higher mag, lower voltage, and lower X-ray energy (soft X-ray) analysis.
This opens up new potential for observing and analyzing specimens, as today’s advanced microscopes, detectors, and spectrometers can overcome the historical limitations of low-kV imaging and microanalysis.
There are still some important details to consider that may not have been explored previously. This webinar will present case studies and examples of the good (and bad) that ultralow kV imaging and analysis offer.
Ultra-low kV and/or ultra-high spatial resolution are extremely powerful tools, requiring great responsibility and caution—or at least attention to the non-intuitive.
This webinar is for those interested in gaining a deeper understanding of SEM to improve imaging results.
Image Credit: JEOL USA, Inc.
About the Presenter
Having been with JEOL USA for 34 years, Vern Robertson was appointed EPMA/Surface Analysis Product Manager in 2016 and continues as SEM Technical Sales Manager, providing in-house and field technical product and customer applications support.
Beginning in 1986, Vern served as the senior SEM Applications Specialist at JEOL. His previous industrial experience included eight years of consulting in an independent testing lab specializing in industrial and environmental problem-solving. His responsibilities included atomic emission and absorption spectroscopy, polarized light optical microscopy, SEM with EDS/ WDS, and X-ray diffraction.