This webinar, first presented at M&M Virtual 2020, covers the advent of direct electron detectors that led to significant improvements, famously termed the “resolution revolution,” in the resolution of cryo-EM structures.
This advancement and other innovations in image processing and data collection effectively brought the attainable resolution for single particle cryo-EM reconstructions into the range where the electron source could become a limitation factor.
This resulted in the rationale for considering alternative solutions to the conventional Schottky FEG, such as the cold FEG, which promises improved coherence.
While it had long been understood that cold FEG could provide certain benefits over thermally assisted FEG, its widespread adoption in cryo-EM was somewhat hindered due to practical limitations.
With the development of JEOL’s CRYO ARM™ microscope series, such limitations were overcome, as detailed in this webinar. This webinar includes reviewing JEOL’s work on a 200kV CRYO ARM™ and briefly looking toward the future.
Please visit JEOL’s CRYO ARM™ web pages for further information and application notes.
Image Credit: JEOL USA, Inc.
About the Presenters
Dr. Jana Ognjenović, Senior Scientist at Frederick National Laboratory for Cancer Research, NIH/NCI.
Dr. Jaap Brink, TEM Biological Applications Manager