Posted in | Microscopy | Battery Materials Testing

STEM Imaging Techniques of Energy Materials

From Nov 7 2024

Aberration correction in scanning/transmission electron microscopy (S/TEM) has permitted direct-interpretable imaging of light elements like O and Li at the atomic level. Observing such elements in their native and resultant forms before and after cycling/degradation is crucial for material performance.

STEM imaging combined with X-ray and energy loss spectroscopy and electronic structure analysis provides a unique position-sensitive image of the material down to the atomic scale.

This webinar will discuss advances in STEM-based characterization techniques for important batteries and other energy materials.

Novel detectors and detection methods, real-time dose control, and chemical spectroscopy will receive special attention, as all of these improve the efficiency and applicability of STEM characterization to energy materials.

 

 

Image Credit: JEOL USA, Inc.

About the Presenters

  • Patrick Phillips, the TEM/FIB Product Manager

In 2012, Dr. Phillips got his PhD in Materials Science and Engineering from Ohio State University. After serving as a Research Assistant Professor at the University of Illinois - Chicago, he joined JEOL USA in 2016.

  • Tom Isabell, Vice President

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