The demand for alleged “workhorse” transmission electron microscopes (TEMs) has been increasing in line with evolving scanning (S)/TEM technologies and techniques.
Researchers and engineers from various industries depend on the unique spatial resolution capabilities S/TEM imaging offers. This technology can deliver crucial structural insights into novel nanomaterials and devices, driving more flexible, reliable instrumentation.
This webinar covers the main elements developed to enable accurate, atomic-scale S/TEM imaging across various industrial applications. Guest speaker Dr. Patrick Phillips, Assistant TEM Product Manager at JEOL USA, explores hardware and operational strategies to optimize image resolution, clarity, and insight from state-of-the-art S/TEM imaging techniques.
This webinar covers the following:
- Developments incorporated in modern S/TEM instruments
- Current capabilities of a standard S/TEM outfitted with a cold field-emission gun
- What new potentialities for analysis are made possible with the current state-of-art S/TEM?
- How can non-aberration corrected S/TEM be leveraged to evaluate and optimize advanced materials and devices?
- How is the field of S/TEM expected to expand and advance in the coming years?
Aberration Correction Is Not as Necessary as It Once Was
For decades, only aberration-corrected S/TEM instruments could capture reliable atomic resolution. Analysts believed that aberration-corrected microscopes—typically costing upwards of a million dollars to purchase, plus expenses for maintenance—were prerequisites for image acquisition at the atomic scale.
The development of accessible tools has upended this preconception. Improvements to cold field-emission sources, large-area silicon drift detectors, and enhanced stabilization in the electron optics of transmission electron microscopes have paved the way to capturing top-quality images, even where aberration correction is absent.
Discover more about how recent technological advancements coalesce with operational strategies to facilitate new kinds of analysis on advanced materials and devices.