Metallurgists and researchers in steel manufacturing require scanning electron microscope (SEM) and energy-dispersive X-ray spectroscopy (EDS) information for process enhancement and failure analysis.
Thermo Scientific’s Phenom ParticleX Steel Desktop SEM is a multipurpose desktop that enables failure analyses and automated characterization of non-metallic additions in steel.
This multipurpose solution for elemental analysis and high-quality imaging of steel samples offers the data required for the efficient production of high-value steels that are in demand. The fast and simple analysis enables users to respond swiftly to customer claims of failures, faults, etc. Moreover, the automated steel inclusion analysis offers users insights into the steelmaking process.
Key Features
Small Footprint
The Phenom ParticleX Steel Desktop SEM requires only standard wall power, enabling extension of the capabilities of analytical laboratories without any changes to the infrastructure. The integrated EDS enables users to easily click-and-go to work using elemental mapping and line scan. This, therefore, displays the quantified element distribution in a line plot.
Ease of Use
The user interface is built on the proven ease-of-use technology applied in successful Phenom Desktop SEMs. The interface facilitates both new and current customers to quickly learn the system with minimum training.
The increased brightness of the unique CeB6 source helps capture high image detail, including rapid automated analysis of steel inclusions.
Industry-Specific Software
The system is built with years of experience in steel inclusion analysis. The default classification rules and analysis recipes enable users to capture any valuable data quickly.
Future-Proof
The default classification rules and analysis recipe enable users to begin with steel inclusion analysis. The system is available with completely customizable classification and recipes, enabling users to achieve new insights in updated recipes.
Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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Electron optical magnification range
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Light optical magnification
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Resolution
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Image resolution options
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- 960x600, 1920x1200, 3840x2400, 7680x4800 pixels
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Acceleration voltages
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- Default: 5 kV, 10 kV and 15 kV
- Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
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Vacuum levels
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Detector
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- Backscattered electron detector (standard)
- Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
- Secondary electron detector (optional)
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Sample size
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- Max. 100x100 mm (up to 36 x 12 mm pin stubs)
- Max. 40 mm height (optional up to 65 mm)
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Sample loading time
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- Light optical <5 s
- Electron optical <60 s
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