With its multifunctional design for additive manufacturing, the Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) offers purity at the microscale.
It has a chamber that can accommodate samples up to 100 mm by 100 mm for analysis. With the fastest vent/load cycle in the world and the highest throughput, the patented venting and loading mechanism is guaranteed.
With the Phenom ParticleX AM Desktop SEM, users can take in-house control of the data:
- Identify particle size distributions, individual particle morphology, and foreign particles
- Monitor critical characteristics of metal powders
- Enhance the powder-bed and powder-fed additive manufacturing processes
Phenom ParticleX AM Desktop SEM Features
SEM Particle Analysis
The Phenom ParticleX AM Desktop SEM has a chamber that can analyze samples up to 100 mm by 100 mm, thanks to a precise and quick motorized stage. The unique loading shuttle maintains the vent/load cycle at an industry-leading loading time of 60 seconds or less, even with this larger sample size, ultimately providing faster throughput than other SEM systems.
SEM Elemental Mapping
Thanks to the elemental mapping and line scan features, users can start working with just one click. The quantified element distribution is displayed in a line plot via the line scan functionality. This is particularly helpful for examining coatings, edges, and cross sections of paints, coatings, and other multilayered samples.
Additive Manufacturing Testing
Numerous dimensions, including minimum and maximum diameter, perimeter, aspect ratio, roughness, and feret diameter, are measured by the Phenom ParticleX AM Desktop SEM. These can all be shown as 10%, 50%, or 90% values (d10, d50, d90).
Secondary Electron Detector
The Phenom ParticleX AM Desktop SEM can accept an additional secondary electron detector (SED). The SED is the best tool for obtaining precise surface information about the sample because it gathers low-energy electrons from the sample's uppermost layer. The SED can greatly aid studying microstructures, fibers, and particles, as well as other applications where topography and morphology are crucial.
Phenom ParticleX AM Desktop SEM Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
| . |
. |
|
Electron optical
|
- Long lifetime thermionic source (CeB6 )
- Multiple beam currents
|
|
Electron optical magnification range
|
|
|
Light optical magnification
|
|
|
Resolution
|
|
|
Image resolution options
|
- 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
|
|
Acceleration voltages
|
- Default: 5 kV, 10 kV and 15 kV
- Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
|
|
Vacuum levels
|
|
|
Detector
|
- Energy dispersive X-ray spectroscopy (EDS) detector (standard)
- Secondary electron detector (optional)
|
|
Sample size
|
- Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
- Max. 40 mm (h)
|
|
Sample loading time
|
- Light optical <5 s
- Electron optical <60 s
|