Thermo Scientific Velox Software integrates complete access to (scanning) transmission electron microscope (STEM and TEM) optics and detectors to give users the best possible experimental control. Velox Software provides high yield, reproducibility, and support for quantitative STEM and TEM material analysis.
In conjunction with the Thermo Scientific Super-X and Dual-X Detector Systems, Velox Software provides special packages for energy-dispersive X-Ray spectroscopy (EDS, also called EDX) applications. A robust mapping engine combines multiple techniques optimized for transmission electron microscopy. The highest yield of EDS spectrum images can be obtained with on-the-fly drift correction, recursive mapping, independent channel readout, and unique absorption correction with holder compensation.
Velox Transmission Electron Microscopy Software Features
Integrated Ergonomic User Interface
Superior quality in imaging and compositional mapping through sophisticated drift compensation techniques such as cross correlations in quick recursive mapping and drift corrected frame integration (DCFI). Furthermore, Velox Software provides drift compensation for spectrum imaging—a feature created especially for difficult TEM environments.
Time-Resolved XEDS
Frame-by-frame removal through recursive mapping using the "peel back" function and time-resolved XEDS allows for dynamic compositional mapping, which reduces artifacts on compositional analysis on beam-sensitive material.
High-Contrast Imaging
Light and heavy element high-contrast atomic imaging using a novel integrated differential phase contrast (iDPC) mode. low-dose, high-contrast imaging of light samples to capture natural-state images of materials sensitive to beams.
Interactive Detector Layout Interface
Maximum repeatability, optimal experimental management, and comprehensive documentation of multidetector instruments through an interactive detector layout interface and automated retention of all essential metadata.
EDS Quantification Software
Robust, unique EDS quantification software with four independent detector readouts and compensation of holder shadowing at any tilt. Fast post-processing of EDS data and real-time feedback during acquisition are provided by high-speed EDS quantification.
Dynamic Studies
Flexible STEM and TEM movie recording for dynamic studies.
Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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| TEM imaging |
Supported Hardware |
SmartCam, Ceta Camera with speed enhancement |
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Pixels |
512, 1k, 2k, 4k, binning 2x, 4x, 8x |
| STEM imaging |
Supported Hardware |
HAADF detector, triple segmented BF/DF detector, Panther STEM Detection System |
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Number of signals |
Up to 5 STEM signals or up to 11 STEM+EDS signals* |
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Speed |
50 nsec/pixel |
| Energy dispersive X-ray analysis* |
Supported Hardware |
Super-X G1/Super-X G2/Dual-X/Single-X/Bruker 30mm2/Ultra-X |
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Multimodal |
STEM+EDS, STEM+EDS+EELS and STEM+Camera+EDS |
| System requirements |
Thermo Scientific Talos and Themis STEM and TEM platforms with Windows 7 or Windows 10 64-bit operating systems |
| Post-processing system requirements |
Windows 10 or Windows 11 workstation with at least 16GB RAM, Nvidia graphic card with at least 1GB of memory, 6 cores CPU or higher, SSD
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* optional and functions only available if corresponding hardware is part of the column configuration.