The Thermo Scientific Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope specially engineered for optimal performance and productivity in diverse Materials Science samples and applications.
Featuring the standard X-Twin pole piece gap, which offers unparalleled flexibility in applications, and a consistently reliable electron column, the microscope creates possibilities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.
Talos F200i Transmission Electron Microscope Advantages
Tailored for multi-user and multi-discipline environments, the Talos F200i (S)TEM is equally well-suited for novice users. It features the Thermo Scientific Velox user interface, offering immediate familiarity as it is shared across all Thermo Scientific TEM platforms.
The automation of all TEM daily tunings ensures the best and most reproducible setup. The Align Genie automation software streamlines the learning curve for novice operators, alleviates tensions in a multi-user environment, and enhances the time to data for experienced operators. For chemical analysis, a side-entry retractable Energy Dispersive X-ray Spectroscopy (EDS) detector can be incorporated into the configuration.
Compact Design
The compact footprint and dimensions of the Talos F200i make it adaptable to more confined spaces. This smaller design not only simplifies access to service requirements but also contributes to a reduction in infrastructure and support costs.
Productivity For All Users
To boost productivity, particularly in multi-user, multi-material settings, the Talos F200i incorporates constant-power objective lenses, a low-hysteresis design, and remote operation capabilities with the SmartCam Camera.
These features facilitate straightforward and reproducible mode and high-tension switches. The system also includes educational online help, where pressing F1 while hovering the mouse over a control panel provides quick access to relevant information.
Key Features
Available With a Wide Range of High-Resolution Field Emissions Guns (FEG)
Select from the options of S-FEG, high-brightness X-FEG, or the ultra-high-brightness Cold Field Emission Gun (X-CFEG). The X-CFEG offers an optimal combination of the finest (S)TEM imaging along with superior energy resolution.
Available With Dual EDS Technology
Select the most suitable EDS detector for your requirements, with options ranging from a single 30 mm² detector to dual 100 mm² detectors. This range allows for high throughput or low-dose analytics.
High-Quality STEM/TEM Images and Accurate EDS
Effortlessly obtain high-quality TEM or STEM images through the innovative and user-friendly Velox Software interface. The unique EDS absorption correction featured in Velox Software ensures the utmost accuracy in quantification.
Best All-Round In Situ Capabilities
Incorporate tomography or in situ sample holders into the setup. With fast cameras, intelligent software, and the broad X-TWIN objective lens gap, achieve 3D imaging and in situ data acquisition with minimal compromise to resolution and analytical capabilities.
Increased Productivity
Benefit from an ultra-stable column and remote operation facilitated by the SmartCam Camera, along with constant-power objective lenses for rapid mode and high-voltage (HT) switches. This setup ensures fast and straightforward switching, ideal for multi-user environments.
Most Repeatable Data
Automate all daily TEM tunings, including focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center, ensuring users consistently begin with optimal imaging conditions. This automation enables reproducible experiments, allowing more focus on research and less on tool adjustments.
Large Field-Of-View Imaging at High Speed
The 4 k × 4 k Ceta CMOS camera, with its expansive field of view, facilitates live digital zooming characterized by high sensitivity and speed across the entire high-tension range.
Compact Design
The smaller footprint and dimensions of this tool simplify its accommodation in more challenging spaces, concurrently leading to reduced infrastructure and support costs.
Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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| TEM |
- Line resolution: ≤0.10 nm
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Operating system
XX units |
- Controller: Windows® 10
- Remote controllable: Yes
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| Vacuum system |
- Airlock pumping: Oil- and vibration-free
- Cold trap: Standard
- Long-duration Dewar: Optional - at least 4 days stand-time (between refills)
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| STEM imaging |
- STEM resolution:
- ≤0.16 nm (S-FEG/X-FEG)
- ≤0.14 nm with 100pA (X-CFEG)
- Detectors: HAADF and/or On-axis Panther BF/DF
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Energy disersive x-ray
spectroscopy (EDS) |
- Detector size (Bruker X-flash): 30, 100 or dual 100 mm2
- Retractable: Yes, motorized
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Electron energy loss
spectroscopy (EELS) |
- ≤0.8 eV (S-FEG/X-FEG)
- ≤0.3 eV (X-CFEG)
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| Gun brightness 200 kV |
- 4×108 A /cm2 srad (S-FEG)
- 1.8×109 A /cm2 srad (X-FEG)
- 2.4×109 A /cm2 srad (X-CFEG)
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