Industry-leading energy dispersive X-Ray spectroscopy (EDS) signal detection is combined with exceptional high-resolution STEM and TEM imaging in the Thermo Scientific Talos F200X STEM scanning transmission electron microscope. Four in-column SDD Super-X detectors with exceptional purity perform 2D/3D chemical characterization with compositional mapping.
The Talos F200X scanning transmission electron microscope enables high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with rapid navigation for dynamic microscopy, as well as the fastest and most accurate EDS analysis in all dimensions.
Reduced environmental sensitivity is another feature of the Talos F200X scanning transmission electron microscope. The instrument enclosure moderates the effects of air pressure waves, air flows, and minute temperature changes in the TEM chamber.
STEM Imaging and Chemical Analysis
The Talos F200X (S)TEM provides rapid, accurate, quantitative characterization of nanomaterials in several dimensions. The Talos F200X (S)TEM has cutting-edge capabilities that boost throughput, accuracy, and user-friendliness, making it perfect for advanced research and analysis in government, academic, semiconductor, and industrial settings.
Large-area correlative imaging at high resolution is becoming more and more necessary because it gives researchers statistically sound data while preserving the context of their observations. Thermo Scientific Maps Software (enabled by Thermo Scientific Velox Software) automatically obtains a variety of images from a sample and stitches them together to produce a large final image.
Unattended image acquisition is even possible. All the advantages discussed in this section are included in the Automated Particle Workflow pack, which also includes special processing on a dedicated processing PC using Thermo Scientific Avizo2D software. The parameters of nanoparticles (such as size, area, perimeter, shape, factor, contacts, and more) can also be obtained automatically.
The fully automated and unattended software bundle allows the user to utilize the Talos F200X (S)TEM around the clock, obtain considerably better statistics, and substantially increase repeatability as operator bias is eliminated. Align Genie Automation Software eases the learning curve for inexperienced operators, minimizes tensions in a multi-user setting, and enhances the expert operator's time to date.
Key Features
Talos F200X G2 Transmission Electron Microscope Features
Available With a Wide Range of High-Resolution Field Emissions Guns (FEG)
Select the ultra-high-brightness Cold Field Emission Gun (X-CFEG) or high-brightness X-FEG. The optimal energy resolution and (S)TEM imaging are combined in X-CFEG.
Faster Time to Chemical Composition
Quick, accurate quantitative EDS analysis provides highly clean, nanoscale details in 2D and 3D.
Space for More
For dynamic tests, include application-specific in situ sample holders.
Highly Repeatable Data Collection
Users always start from optimum imaging conditions since all daily TEM tunings (including focus, eccentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center) are automated. As experiments can be replicated reproducibly, users can concentrate on research rather than equipment operation.
Intuitive Software
Thermo Scientific Velox Software provides rapid and simple acquisition and evaluation of multimodal data.
Better Image Data
Better contrast for high-quality images is offered by high throughput STEM imaging with simultaneous, multiple signal detection.
High-Quality (S)TEM Images and Accurate EDS
Obtain high-quality STEM or TEM images with the advanced, user-friendly Velox Software interface. Velox Software's unique EDS absorption correction allows for extremely precise measurement.
Increased Productivity
Ultra-stable column and remote operation using the SmartCam Camera. Constant-power objective lenses for swift mode and high-voltage (HT) switches. For multi-user situations, switching is quick and simple.
Product Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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| HRTEM line resolution |
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| STEM resolution |
- ≤0.16 nm (X-FEG)
- ≤0.14 nm with 100 pA (X-CFEG)
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| Super-X EDS system |
- 4 SDD symmetric design, windowless, shutter-protected
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| Electron energy loss spectroscopy (EELS) energy resolution |
- ≤0.8 eV (X-FEG)
- ≤0.3 eV (X-CFEG
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| Gun brightness at 200 kV |
- 1.8×109 A /cm2 srad (X-FEG)
- 2.4×109 A /cm2 srad (X-CFEG)
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